It is allowed to index the diffraction pattern from a list of selected candidate phases. The latter two accessories are mandatory to control the specimen orientation, which has not been possible before in a scanning electron microscope. Note that pattern simulation is important and generally required to confirm the pattern index.ĥ. The instrument is equipped with a STEM detector, double-tilt TEM specimen holder, and a charge-coupled-device camera for the acquisition of on-axis diffraction patterns. Simulated diffraction pattern is overlapped on original image to a straightforward comparison. A unique approach to perform accurate diffraction pattern analysis and measurement.Ĥ. This program is based on "DM crystallography" to have the crystal structure and phase information of candidate phases.ģ. Different types of electron diffraction patterns are accepted including Fast-Fourier-Transformation (FFT) of high-resolution lattice image, Select-Area-Diffraction-Pattern (SADP), Convergent-Beam-Electron-Diffraction (CBED), Nano-Beam-Electron-Diffraction (NBED), and poly crystal diffraction pattern.Ģ. In TEM/ED we detect scattered/diffracted electrons in a different way and obtain electron diffraction pattern, which is analogous to X-ray and neutron. Through this program, real-time electron diffraction index and simulation can be performed easily. This DigitalMicrograph script is to automate electron diffraction analysis, measurement, index, and simulation, as convenient as X-ray diffraction analysis.
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